Automatic Inspection System for Cmos Camera Defect

This paper presents a development of automatic complementary metal-oxidesemiconductor (CMOS) camera inspection system to examine defects. The image capture board based on embedded linux using system-on-a-chip (SoC) and a complex programmable logic device (CPLD) is developed to capture CMOS sensor data. The captured sensor data is transferred to the host computer through TCP/IP socket communication to perform fast inspection. The liquid crystal display (LCD) monitor is used to load the inspection charts electrically so that it can reduce their changing time. The various algorithms for performing error inspection were implemented such as the line dot defect inspection and dim defect inspection. Experimental results reveal that the proposed system can focus the lens of CMOS within 5 seconds and recognize various types of defect of CMOS modules with precision and high speed. Copyright © 2005 IFAC